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1

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Inspection and Metrology for Non-Optics Industries - A novel method for overlay measurement by scatterometry

Hsu, Wei-Te, Ku, Yi-Sha, Shyu, Deh-Ming, Huang, Peisen S., Yoshizawa, Toru, Harding, Kevin G.

Year:

2009

Language:

english

File:

PDF, 4.07 MB

english, 2009

2

SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - Study on aero-optical effect of a hypersonic missile infrared image guide

Han, Wei, Zhao, Yuejin, Hu, Xinqi, Yoshizawa, Toru, Wei, Ping, Zheng, Jesse

Year:

2009

Language:

english

File:

PDF, 847 KB

english, 2009

3

SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Wednesday 12 October 2016)] Optical Metrology and Inspection for Industrial Applications IV - Non-uniform sampling knife-edge method for camera modulation transfer function measurement

Han, Sen, Yoshizawa, Toru, Zhang, Song, Duan, Yaxuan, Xue, Xun, Chen, Yongquan, Tian, Liude, Zhao, Jianke, Gao, Limin

Year:

2016

Language:

english

File:

PDF, 557 KB

english, 2016

4

SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - Real-time scanner error correction in white light interferometry

Han, Sen, Yoshizawa, Toru, Zhang, Song, Chen, Dong, Schmit, Joanna, Novak, Matt

Year:

2014

Language:

english

File:

PDF, 1.91 MB

english, 2014

5

Upper mantle discontinuities beneath Australia from trans-dimensional Bayesian inversions using multi-mode surface waves and receiver functions

Taira, Toru, Yoshizawa, Kazunori

Journal:

Geophysical Journal International

Year:

2020

File:

PDF, 17.46 MB

2020

6

SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optoelectronic Imaging and Multimedia Technology - Digital camera auto white balance based on color temperature estimation clustering

Zhang, Lei, Liu, Peng, Liu, Yuling, Yu, Feihong, Yoshizawa, Toru, Wei, Ping, Zheng, Jesse, Shimura, Tsutomu

Year:

2010

Language:

english

File:

PDF, 2.22 MB

english, 2010

7

SPIE Proceedings [SPIE Optomechatronic Systems III - Stuttgart, Germany (Tuesday 12 November 2002)] Optomechatronic Systems III - Development of laser direct imager

Tachihara, Satoru, Shimizu, Shuichi, Yoshizawa, Toru

Year:

2002

Language:

english

File:

PDF, 258 KB

english, 2002

8

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Dimensional Optical Metrology and Inspection for Practical Applications II - Surface profile measurement of a diffraction grating by a laser beam scanning interferometer using sinusoidal phase modulation

Sasaki, Osami, Kubota, Takuya, Choi, Samuel, Suzuki, Takamasa, Harding, Kevin G., Huang, Peisen S., Yoshizawa, Toru

Year:

2013

Language:

english

File:

PDF, 682 KB

english, 2013

9

SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - Optimized design of a TOF laser range finder based on time-correlated single-photon counting

Han, Sen, Yoshizawa, Toru, Zhang, Song, Wang, Huanqin, Yang, Yixin, Huang, Zhe, Cao, YangYang, Gui, Huaqiao

Year:

2014

Language:

english

File:

PDF, 2.35 MB

english, 2014

10

SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - Detection technique of targets for missile defense system

Guo, Hua-ling, Deng, Jia-hao, Cai, Ke-rong, Yoshizawa, Toru, Wei, Ping, Zheng, Jesse

Year:

2009

Language:

english

File:

PDF, 1.02 MB

english, 2009

11

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Dimensional Optical Metrology and Inspection for Practical Applications II - On-machine laser triangulation sensor for precise surface displacement measurement of various material types

Žbontar, Klemen, Podobnik, Boštjan, Povše, Franc, Mihelj, Matjaž, Harding, Kevin G., Huang, Peisen S., Yoshizawa, Toru

Year:

2013

Language:

english

File:

PDF, 464 KB

english, 2013

12

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Two- and Three-Dimensional Methods for Inspection and Metrology VI - Measurement of optical free-form surfaces with fringe projection

Breitbarth, Martin, Huang, Peisen S., Yoshizawa, Toru, Braeuer-Burchardt, Christian, Kuehmstedt, Peter, Harding, Kevin G., Heinze, Matthias, Notni, Gunther

Year:

2008

Language:

english

File:

PDF, 2.92 MB

english, 2008

13

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Transient state of polarization in optical ground wire caused by lightning and impulse current

Kurono, Masahiro, Isawa, K., Kuribara, Masayuki, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 166 KB

english, 1996

14

SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Wednesday 12 October 2016)] Optical Metrology and Inspection for Industrial Applications IV - Hybrid probing technique for coordinate measurement with optically trapped micro sphere

Han, Sen, Yoshizawa, Toru, Zhang, Song, Yamaguchi, Yuki, Michihata, Masaki, Mizutani, Yasuhiro, Takaya, Yasuhiro

Year:

2016

Language:

english

File:

PDF, 963 KB

english, 2016

15

SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - High-speed three-dimensional shape measurement using spatial frequency encoding and DLP projector

Han, Sen, Yoshizawa, Toru, Zhang, Song, Tu, Yanshuai, Li, Yong, Jin, Hongzhen, Wang, Jian

Year:

2014

Language:

english

File:

PDF, 1.03 MB

english, 2014

16

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Laser Interferometry IX: Techniques and Analysis - Flatness measurement by a UV moire technique

Fujiwara, Hisatoshi, Kodera, Yutaka, Otani, Yukitoshi, Yoshizawa, Toru, Kujawinska, Malgorzata, Brown, Gordon M., Takeda, Mitsuo

Year:

1998

Language:

english

File:

PDF, 1.79 MB

english, 1998

17

SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Phase shift based measurements using a pocket LCD projector

Williams, Yana, Harding, Kevin, Huang, Peisen S., Harding, Kevin, Yoshizawa, Toru

Year:

2010

Language:

english

File:

PDF, 2.09 MB

english, 2010

18

SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - Absolute measurement of optical surface profile with a Fizeau interferometer

Sasaki, Osami, Watanabe, Akihiro, Choi, Samuel, Suzuki, Takamasa, Harding, Kevin G., Huang, Peisen S., Yoshizawa, Toru

Year:

2012

Language:

english

File:

PDF, 882 KB

english, 2012

19

SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - The art of specifying surface quality

Han, Sen, Yoshizawa, Toru, Zhang, Song, Stover, John, Han, Sen

Year:

2014

Language:

english

File:

PDF, 279 KB

english, 2014

20

SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Wednesday 12 October 2016)] Optical Metrology and Inspection for Industrial Applications IV - Binocular stereo vision system based on phase matching

Han, Sen, Yoshizawa, Toru, Zhang, Song, Liu, Huixian, Huang, Shujun, Gao, Nan, Zhang, Zonghua

Year:

2016

Language:

english

File:

PDF, 539 KB

english, 2016

21

SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Study on a novel illuminance calibration method for signal to noise ratio measurement of image intensifier

Shi, Jifang, Harding, Kevin, Huang, Peisen S., Li, Hongguang, Cui, Dongxu, Yoshizawa, Toru, Cao, Feng, Sun, Yunan, Xie, Qi

Year:

2010

Language:

english

File:

PDF, 207 KB

english, 2010

22

Carotenoids of shellfishes. Absolute configuration of pectenolone.

HIRAOKA, Katsuyuki, MATSUNO, Takao, ITO, Masayoshi, TSUKIDA, Kiyoshi, SHICHIDA, Yoshinori, YOSHIZAWA, Tõru

Journal:

NIPPON SUISAN GAKKAISHI

Year:

1982

Language:

english

File:

PDF, 183 KB

english, 1982

23

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Interferometry XV: Techniques and Analysis - Uni-axial measurement of three-dimensional surface profile by liquid crystal digital shifter

Otani, Yukitoshi, Towers, Catherine E., Schmit, Joanna, Kobayashi, Fumio, Mizutani, Yasuhiro, Creath, Katherine, Watanabe, Shuugo, Harada, Manabu, Yoshizawa, Toru

Year:

2010

Language:

english

File:

PDF, 2.17 MB

english, 2010

24

[IEEE 2014 IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS) - Bangalore, India (2014.12.14-2014.12.16)] 2014 IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS) - Resonant power supply noise reduction using on-die decoupling capacitors embedded in organic interposer

Nakura, Toru, Kano, Masahiro, Yoshizawa, Masamitsu, Oyamada, Seisei, Hattori, Atsunori, Asada, Kunihiro

Year:

2014

Language:

english

File:

PDF, 1.04 MB

english, 2014

25

SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - Comparing digital-light-processing (DLP) and liquid-crystal-display(LCD) projection technologies for high-quality 3D shape measurement

Han, Sen, Yoshizawa, Toru, Zhang, Song, Gong, Chen, Li, Beiwen, Zhang, Song

Year:

2014

Language:

english

File:

PDF, 1.05 MB

english, 2014

26

Chapter 2 Primary photochemical events in the rhodopsin molecule

Tôru Yoshizawa, Hideki Kandori

Journal:

Progress in Retinal Research

Year:

1991

Language:

english

File:

PDF, 1.81 MB

english, 1991

27

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Inspection and Metrology for Non-Optics Industries - High precision calibration method of intrinsic parameters for fish-eye cameras

Komagata, Hideki, Ishii, Ikuo, Makino, Hideo, Takahashi, Akira, Wakatsuki, Daisuke, Huang, Peisen S., Yoshizawa, Toru, Harding, Kevin G.

Year:

2009

Language:

english

File:

PDF, 449 KB

english, 2009

28

SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Phase error correction based on Inverse Function Shift Estimation in Phase Shifting Profilometry using a digital video projector

Liu, Yang, Xi, Jiangtao, Yu, Yanguang, Chicharo, Joe, Harding, Kevin, Huang, Peisen S., Yoshizawa, Toru

Year:

2010

Language:

english

File:

PDF, 1.34 MB

english, 2010

29

SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Profilometry using Fizeau-interferometer based on optical comb interferometry and sinusoidal phase modulation method

Choi, Samuel, Harding, Kevin, Huang, Peisen S., Miyatsuka, Hidetaka, Sasaki, Osami, Yoshizawa, Toru, Suzuki, Takamasa

Year:

2010

Language:

english

File:

PDF, 576 KB

english, 2010

30

SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II - Structured lighting method using moire pattern projection

Yoshizawa, Toru, Yamaguchi, Takayoshi, Takahashi, Hiroshi, Ikeda, Naohito, Yamamoto, Masayuki, Nagamori, Shigeru, Harding, Kevin G., Miller, John W. V.

Year:

2002

Language:

english

File:

PDF, 697 KB

english, 2002

31

SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II - Surface profile measurement of specular objects by grating projection method

Yamamoto, Masayuki, Tonooka, Masahito, Yoshizawa, Toru, Harding, Kevin G., Miller, John W. V.

Year:

2002

Language:

english

File:

PDF, 694 KB

english, 2002

32

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Inspection and Metrology for Non-Optics Industries - Optimal checkerboard selection for structured light system calibration

Lohry, William, Huang, Peisen S., Yoshizawa, Toru, Xu, Ying, Zhang, Song, Harding, Kevin G.

Year:

2009

Language:

english

File:

PDF, 5.11 MB

english, 2009

33

SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - System analysis and simulation of airborne scannerless 3D imaging lidar

Guo, Pan, Yoshizawa, Toru, Wei, Ping, Hao, Qiwei, Chen, Siying, Zheng, Jesse

Year:

2009

Language:

english

File:

PDF, 1.69 MB

english, 2009

34

Research on solidification of resin in stereolithography

Yoshizawa, Toru

Journal:

Optical Engineering

Year:

2003

Language:

english

File:

PDF, 239 KB

english, 2003

35

Cone Visual Pigments are Present in Gecko Rod Cells

Daisuke Kojima, Toshiyuki Okano, Yoshitaka Fukada, Yoshinori Shichida, Toru Yoshizawa and Thomas G. Ebrey

Journal:

Proceedings of the National Academy of Sciences

Year:

1992

Language:

english

File:

PDF, 888 KB

english, 1992

36

Shadow moire topography by means of the phase-shift method

Yoshizawa, Toru

Journal:

Optical Engineering

Year:

1993

Language:

english

File:

PDF, 877 KB

english, 1993

37

SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optoelectronic Imaging and Multimedia Technology - An efficient parallel processing approach to fractal image compression

Yoshizawa, Toru, Xie, Xiaohong, Wu, Rongteng, Wei, Ping, Zheng, Jesse, Shimura, Tsutomu

Year:

2010

Language:

english

File:

PDF, 250 KB

english, 2010

38

Handbook of Optical Metrology (Principles and Applications) || Interferometry

Yoshizawa, Toru

Year:

2009

Language:

english

File:

PDF, 1.26 MB

english, 2009

39

Displacement measurement utilizing contrast variation of a projected pattern

Yoshizawa, Toru

Journal:

Optical Engineering

Year:

1992

Language:

english

File:

PDF, 226 KB

english, 1992

40

High-speed three-dimensional shape measurements using multiwavelength spatiotemporal phase shifting

Wakayama, Toshitaka, Yoshizawa, Toru

Journal:

Optical Engineering

Year:

2014

Language:

english

File:

PDF, 2.58 MB

english, 2014

41

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Two- and Three-Dimensional Methods for Inspection and Metrology VI - Challenges and opportunities for 3D optical metrology: what is needed today from an industry perspective

Huang, Peisen S., Harding, Kevin, Yoshizawa, Toru, Harding, Kevin G.

Year:

2008

Language:

english

File:

PDF, 594 KB

english, 2008

42

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Algorithms and Systems for Optical Information Processing IV - Error dispersion algorithms to improve the precision of angle detection for the optical encoder

Matsuzoe, Yuji, Tsuji, Nobuhiko, Yoshizawa, Toru, Javidi, Bahram, Psaltis, Demetri

Year:

2000

Language:

english

File:

PDF, 1.74 MB

english, 2000

43

SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, United States (Monday 20 April 2015)] Dimensional Optical Metrology and Inspection for Practical Applications IV - Geometric and topological feature extraction of linear segments from 2D cross-section data of 3D point clouds

Harding, Kevin G., Yoshizawa, Toru, Ramamurthy, Rajesh, Harding, Kevin, Du, Xiaoming, Lucas, Vincent, Liao, Yi, Paul, Ratnadeep, Jia, Tao

Year:

2015

Language:

english

File:

PDF, 5.08 MB

english, 2015

44

Tanycytic ependymoma of the filum terminale associated with multiple endocrine neoplasia type 1: first reported case

Funayama, Toru, Sakane, Masataka, Yoshizawa, Tomohiro, Takeuchi, Yousuke, Ochiai, Naoyuki

Journal:

The Spine Journal

Year:

2013

Language:

english

File:

PDF, 1.85 MB

english, 2013

45

SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Steam wetness measurement using CCD imaging methods in low-pressure turbine

Wu, Wei, Harding, Kevin, Huang, Peisen S., Qin, Shiqiao, Huang, Zhuqing, Yoshizawa, Toru, Wang, Xingshu, Hu, Chunsheng

Year:

2010

Language:

english

File:

PDF, 1.71 MB

english, 2010

46

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Dimensional Optical Metrology and Inspection for Practical Applications II - OCT based on multi-frequency sweeping Fizeau interferometer with phase modulating method

Choi, S., Watanabe, T., Sasaki, O., Suzuki, T., Harding, Kevin G., Huang, Peisen S., Yoshizawa, Toru

Year:

2013

Language:

english

File:

PDF, 1.20 MB

english, 2013

47

SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optoelectronic Imaging and Multimedia Technology - Virtual vision system with actual flavor by olfactory display

Yoshizawa, Toru, Sakamoto, Kunio, Kanazawa, Fumihiro, Wei, Ping, Zheng, Jesse, Shimura, Tsutomu

Year:

2010

Language:

english

File:

PDF, 24.93 MB

english, 2010

48

SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - Application of digital pulse delay device in range-gated control for range-gated imaging lidar

Yuan, Chaokai, Yoshizawa, Toru, Wei, Ping, Chen, Siying, Zhang, Yinchao, Zheng, Jesse, Qiu, Zongjia, Ni, Guoqiang

Year:

2009

Language:

english

File:

PDF, 329 KB

english, 2009

49

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Two- and Three-Dimensional Methods for Inspection and Metrology VI - High dynamic range scanning technique

Huang, Peisen S., Zhang, Song, Yau, Shing-Tung, Yoshizawa, Toru, Harding, Kevin G.

Year:

2008

Language:

english

File:

PDF, 1.03 MB

english, 2008

50

SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Calibration and image enhancement algorithm of portable structured light 3D gauge system for improving accuracy

Tao, Li, Harding, Kevin, Huang, Peisen S., Harding, Kevin, Jia, Ming, Yoshizawa, Toru, Song, Guiju

Year:

2010

Language:

english

File:

PDF, 710 KB

english, 2010

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